Обложка книги Integrated Circuit Test Engineering: Modern Techniques

Integrated Circuit Test Engineering: Modern Techniques

ISBN: 1846280230;
Издательство: Springer
Страниц: 362

Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test engineering activities during development and production. Test engineering must also be more closely interwoven with microelectronic design. An understanding of circuit test engineering is vital to any student desiring a career involving any stage in the design or manufacture of integrated circuits. Taking a three-pronged approach – dealing with test engineering from traditional-test, design and manufacturing view-points – Integrated Circuit Test Engineering encapsulates the subject as it stands today. After an introduction covering background from basic testing rules to trends in technology, the reader learns about: • fabrication processes; • a diverse and complete...